Home | Customer Support | Download Center | Literature | Search

 

Home
Company
Metrology Products
Software Products
Applications
Measurement Services
Contact Us

 

 

 

Characterizing SiGe

FilmTek™ Advantages

  • Simultaneous determination of SiGe thickness and germanium concentration.
  • Fast, accurate, and repeatable measurement of thin and thick SiGe films.
 

 

                           

 

 

 

 

 

 

 

Copyright© Scientific Computing International 1993-2011. All rights reserved.

Top