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Characterizing OLED Display Materials
FilmTek™ 3000 Advantages
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Combination of reflection and transmission
spectrophotometry allows for accurate characterization of OLED display
materials.
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Transmission spectrophotometry is an ideal method
for measuring absorption and provides better resolution of the film’s
extinction coefficient (k) compared with spectroscopic
ellipsometry.
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Combining reflection and transmission
spectrophotometry provides two data sets with enough information
content to uniquely determine the thickness and optical constants of
thin absorbing films on transparent substrates.
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Analysis of reflection and transmission data
gives accurate thickness values as well as the refractive index and
extinction coefficients as a function of wavelength.
- Using a general dispersion model to model the
optical response reduces the number of fitted parameters required,
eliminating multiple solutions.
- Simultaneous measurement of multiple OLED layer thicknesses.
- Measurement and analysis time of 1-2 seconds per point.
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