Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design.



			Home \| Customer Support \| Download Center \| Literature \| Search


	Home Company Metrology Products Software Products Applications Contact Us

SCI is a world leader in providing high resolution thin-film metrology systems and analysis software products to leading companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design.

FilmTek™ spectrophotometry-based metrology systems come in a variety of configurations, and depending on the model can measure reflection, transmission, multiple angle reflection, spectroscopic ellipsometry, and polarimetry data. FilmTek™ spectroscopic ellipsometers are based on a rotating compensator design and combine spectroscopic ellipsometry with normal incidence reflectometry to provide peak performance from very-thin to very-thick films.

Top